ne

da nije mozda Trisa u Svajcarskoj 1939 ako nije ona onda je neka druga nikome poznata svajcarska firma

Ne

Sta je izmislio... Ts'ai Lun?

Tezina: 1

papir

sez 49

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Koji je limitirajuci faktor pri upotrebi AFM tehnike?

Tezina: 3

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A disadvantage of AFM compared with the scanning electron microscope (SEM) is the image size. The SEM can image an area on the order of millimetres by millimetres with a depth of field on the order of millimetres. The AFM can only image a maximum height on the order of micrometres and a maximum scanning area of around 150 by 150 micrometres.

Another inconvenience is that an incorrect choice of tip for the required resolution can lead to image artifacts. Traditionally the AFM could not scan images as fast as an SEM, requiring several minutes for a typical scan, while an SEM is capable of scanning at near real-time (although at relatively low quality) after the chamber is evacuated. The relatively slow rate of scanning during AFM imaging often leads to thermal drift in the image (Lapshin, 2004, 2007), making the AFM microscope less suited for measuring accurate distances between artifacts on the image

naglasio sam da ne priznajem odgovore na engleskom 

velicina skenirane slike,sporost,sve to u odnosu na elektronski mikrosop takodje AFM skenovi ili slike mogu biti po uticajem"hysteresis" (koga ovo zanima nek nadje) piezoelektricnih materijala tako da moze dociu do ometanja osa sto zahteva softwer za filtraciju i prilagodjenje

sta je primarno, to sto si nabrojao je sve pratece